In
semiconductor manufacturing, metrology — the science of measuring
things — is an absolutely vital part of the manufacturing process. Much
of this analysis is handled by CDSEM (Critical
Dimension Scanning Electron Microscopy) equipment. As process nodes shrink and
manufacturing difficulty increases, the amount of data being collected
per wafer has increased. Foundries now collect more data per wafer than
ever before, and they need to be able to analyze that information
quickly and compare it to other readouts from different pieces of
equipment. Applied Materials has launched a new web backend it calls
TechEdge Prizm that’s designed to offer foundries better data on their
day-to-day production and to do so in a far better manner than what’s
currently available.
This
image is drawn from an IBM 2013 SPIE paper from a study by Eric Solecky
et al: SPIE 8681, Metrology, Inspection, and Process Control for
Microlithography XXVII, 86810D (April 10, 2013); doi:10.1117/12.2010007.
With
the amount of data per fab skyrocketing from 50TB per fab per year at
45nm to 80TB at 28nm, and an estimated
141TB at 14nm, better tools are needed for visualizing and examining
system output closer to real-time. In the past, data was gathered by
individual tools, locally stored, and painful to parse. There was no
unified system for collecting information or comparing results between
tools or across longer periods of time. With Prizm, Applied Materials
hopes to change that. Instead of trying to parse data sets on a
tool-by-tool basis, Prizm can gather data from multiple tools and
present it through a unified interface. Results are searchable and can
be analyzed much more quickly. Total time savings, again according to
Applied Materials, are shown below.
Prizm
allows engineers to see various metrics on individual sections of a
wafer map rather than simply as a chart of total data. Prizm is capable
of showing how specific metrics have changed over time, or comparing
specific metrics from one set of wafers against a later set. According
to Applied Materials, Prizm can improve workflow efficiency by 10x in
certain cases and spares
engineers hours of tedious work manually gathering data. The online
backend also stores data far longer — typical tools preserve data sets
for a month; Applied Materials is guaranteeing seven years of storage
for particular tools.
We
spoke to Applied Materials about Prizm, and the company offered us a
remote demo of how the service works. In the screenshot above, the
engineer is able to drill down to examine metrics at each specific point
on the wafer. Clicking on a section brings up an image of that area and
gives more information on the selected metrics. The entire system is
designed for flexibility — the engineers can examine and sort by tool
type, process node, or a specific quality measure.
When Big Data matters
I’m
skeptical of “big data” for the same reasons I’m skeptical of “cloud
computing,” but the dramatic overuse and subsequent dilution of the
latter
phrase doesn’t mean there aren’t cases where cloud computing hasn’t offered
something unique and different compared to the services we used to
have. In this case, the term “big data” term also seems to fit. Not
only do these tools produce a staggering amount of information, the
ability to sift and sort said research is essential to progress.
We’ve previously discussed the
mind-boggling levels of accuracy the modern semiconductor industry
requires as a matter of course, and the ability to measure those levels
accurately is a necessity if products are to continue pushing below
20nm. Improving data collection and analysis doesn’t directly solve the
problems facing the semiconductor industry, but it does ensure that the
researchers working at companies like Intel, TSMC, and GlobalFoundries
have access to the data they need to investigate defects more quickly.
- By Joel Hruska